Training on semiconductor devices, design and manufacturing

Name: Training on semiconductor devices, design and manufacturing
Start: 2013-07-01T08:00:00+02:00
End: 2013-07-02T19:15:00+02:00
Location: Katane Palace Hotel, Catania (Italy)

1–2 Jul 2013

Katane Palace Hotel, Catania (Italy)

Europe/Zurich timezone

Overview
Timetable
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Back to PicoSEC-MC Net webpage

Support

rita.giuffredi@cern.ch

X-Ray Photoelectron Spectroscopy (XPS) and Secondary Ion Mass Spectrometry (SIMS)

2 Jul 2013, 14:30

Katane Palace Hotel, Catania (Italy)

Via Finocchiaro Aprile, 110 - Catania (Italy)

Surface Analysis and Solids Characterization

Dr Lucio Renna (ST Microelectronics)

Slides

SIMS_-XPS_020713_luc.pdf

Training on semiconductor devices, design and manufacturing

Support

X-Ray Photoelectron Spectroscopy (XPS) and Secondary Ion Mass Spectrometry (SIMS)

Katane Palace Hotel, Catania (Italy)

Speaker

Presentation materials

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Training on semiconductor devices, design and manufacturing

Support

Speaker

Presentation materials