Login

Training on semiconductor devices, design and manufacturing

1–2 Jul 2013
Katane Palace Hotel, Catania (Italy)
Europe/Zurich timezone

Support

Session

Surface Analysis and Solids Characterization

2 Jul 2013, 14:30
Katane Palace Hotel, Catania (Italy)

Katane Palace Hotel, Catania (Italy)

Via Finocchiaro Aprile, 110 - Catania (Italy)

Conveners

Surface Analysis and Solids Characterization

  • L. Renna (ST Microelectronics)
  • Domenico Mello (ST Microelectronics)

Presentation materials

There are no materials yet.

  1. 8. X-Ray Photoelectron Spectroscopy (XPS) and Secondary Ion Mass Spectrometry (SIMS)
    Dr Lucio Renna (ST Microelectronics)
    02/07/2013, 14:30
  2. 9. Optical Microscopy, Fault Detection and Isolation Techniques
    Dr Domenico Mello (ST Microelectronics)
    02/07/2013, 15:30
  3. 10. Samples Preparation and Transmission Electron Microscopy (TEM)
    Dr Domenico Mello (ST Microelectronics)
    02/07/2013, 16:50
  4. 11. Focused Ion Beam (FIB) and Scanning Electron Microscopy (SEM)
    Dr Domenico Mello (ST)
    02/07/2013, 17:50
Building timetable...