Training on semiconductor devices, design and manufacturing

Session

Surface Analysis and Solids Characterization

2 Jul 2013, 14:30

Katane Palace Hotel, Catania (Italy)

Conveners

Surface Analysis and Solids Characterization

• L. Renna (ST Microelectronics)
• Domenico Mello (ST Microelectronics)

8. X-Ray Photoelectron Spectroscopy (XPS) and Secondary Ion Mass Spectrometry (SIMS)

Dr Lucio Renna (ST Microelectronics)

02/07/2013, 14:30

9. Optical Microscopy, Fault Detection and Isolation Techniques

Dr Domenico Mello (ST Microelectronics)

02/07/2013, 15:30

10. Samples Preparation and Transmission Electron Microscopy (TEM)

Dr Domenico Mello (ST Microelectronics)

02/07/2013, 16:50

11. Focused Ion Beam (FIB) and Scanning Electron Microscopy (SEM)

Dr Domenico Mello (ST)

02/07/2013, 17:50