11th RD50 Workshop

Epitaxial silicon detectors irradiated with protons and neutrons

12 Nov 2007, 16:30

20m

40-S2-C01 (CERN)

Defect Engineering and Pad Detector Characterization Pad Detector Characterization & Defect Engineering

Speaker

Katharina Kaska (CERN, Technische Universitaet Wien)

Description

A series of epitaxial detectors of 150 mum thickness produced by different producers (IRST, CNM, HIP) will be compared to each other (CV,IV,CCE) after proton and neutron irradiation.

Presentation materials

Slides

071112RD50KASKA-1.pdf

071112RD50KASKA-1.ppt