Speaker
Vitaliy Fadeyev
(University of California,Santa Cruz (US))
Description
We are pursuing a “slim edge” technology which allows a drastic reduction of inactive region along the perimeter of silicon detectors. Such reduction would benefit construction of large-area tracker and imaging systems. Key components of this method are surface scribing, cleaving, and passivation of the resulting sidewall. We will give a short overview of the project and describe recent progress. A particular emphasis will be given to device performance physics: charge collection near the edge and studies of radiation hardness of the slim edge technology.
Primary author
Vitaliy Fadeyev
(University of California,Santa Cruz (US))
