Scribe-Cleave-Passivate (SCP) Slim Edge Technology

Sep 2, 2013, 5:00 PM
20m
Dahlia (B2F) (International Conference Center Hiroshima)

Dahlia (B2F)

International Conference Center Hiroshima

1-5 Nakajima-cho Naka-ku, Hiroshima Japan
ORAL Pixels (including CCD's) - Charged particle tracking Session 2

Speaker

Vitaliy Fadeyev (University of California,Santa Cruz (US))

Description

We are pursuing a “slim edge” technology which allows a drastic reduction of inactive region along the perimeter of silicon detectors. Such reduction would benefit construction of large-area tracker and imaging systems. Key components of this method are surface scribing, cleaving, and passivation of the resulting sidewall. We will give a short overview of the project and describe recent progress. A particular emphasis will be given to device performance physics: charge collection near the edge and studies of radiation hardness of the slim edge technology.

Primary author

Vitaliy Fadeyev (University of California,Santa Cruz (US))

Presentation materials