2–4 Jun 2008
Ljubljana, Slovenia
Europe/Zurich timezone

Charge collection measurements on MICRON RD50 strip detectors and diodes irradiated with protons, pions and neutrons

3 Jun 2008, 11:50
20m
Ljubljana, Slovenia

Ljubljana, Slovenia

Defect Engineering and Pad Detector Characterization Full Detector Systems

Speaker

Gregor Kramberger (Jozef Stefan Institute)

Description

The systematic studies of charge collection were performed on strip and pad detectors of n and p type produced on Fz and MCz silicon. The detectors were irradiated with 24 GeV protons, 200 MeV pions and reactor neutrons up to equivalent fluences of 1.2e15 cm-2. It was shown that the to larger extent the CCE is determined by Vfd for both strips and pads. Although strip detectors perform better in terms of CCE particularly at lower voltages, but the Q-V plots are similar. The correlation of Vfd from C-V and Q-V agrees well. Charged hadrons appear more damaging for CCE at the same equivalent fluence.

Primary author

Gregor Kramberger (Jozef Stefan Institute)

Co-authors

Igor Mandić (Jožef Stefan Institute) Marko Mikuž (Jožef Stefan Institute) Vladimir Cindro (Jozef Stefan Institute)

Presentation materials