10th International Conference on Radiation Effects on Semiconductor Materials, Detectors and Devices

Name: 10th International Conference on Radiation Effects on Semiconductor Materials, Detectors and Devices
Start: 2014-10-08T08:00:00+02:00
End: 2014-10-10T18:00:00+02:00
Location: Firenze, Italy

8–10 Oct 2014

Firenze, Italy

Europe/Zurich timezone

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mara.bruzzi@unifi.it

Details for Shuhuan Liu

Title: Dr

Affiliation: School of Nuclear Science and Technology, Xi’an Jiaotong University, Xi’an, Shaanxi, 710049,P.R. China

Study on the Total Ionizing Dose Effects of SiGe HBTs Irradiated with 60Co γ Rays
Primary Experimental Radiation Effects Results of 28 Nanometer Configuration System-on-Chip(Xilinx Zynq-7010 SoC)
Primary Design and Numerical Simulation Studies on 3D Si SOI Microdosimeter

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10th International Conference on Radiation Effects on Semiconductor Materials, Detectors and Devices

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Author in the following contributions