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10th International Conference on Radiation Effects on Semiconductor Materials, Detectors and Devices
10th International Conference on Radiation Effects on Semiconductor Materials, Detectors and Devices

8–10 Oct 2014
Firenze, Italy
Europe/Zurich timezone
  • Overview
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  • Call for Abstracts
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    Support

    • mara.bruzzi@unifi.it

    Details for Piotr Maj

    AGH UST

    Author in the following contribution

    • High Intensity Irradiation Influence on Gain, Noise nad Offset Univormity of a Pixel Detector Readout designed in 130nm CMOS
    CERN
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