Speaker
Christian Gallrapp
(CERN)
Description
Red and IR LASER TCT measurements have been performed on LGAD samples fabricated in the Run7062. The study focuses on charge collection and gain properties before and after irradiation with neutron and protons up to fluences of 1E16$n_{eq}cm^{-2}$. A second focus is the analysis of inhomogeneous behavior observed during TCT surface scans with front and back side exposure. In unirradiated LGAD diodes this effect seems to appear only at low bias voltages while a shift to higher bias voltages can be observed after irradiation.
Author
Christian Gallrapp
(CERN)
