27 August 2017 to 1 September 2017
RAI Congress Center, Amsterdam, The Netherlands
Europe/Amsterdam timezone

Uniaxial Strain Induced Critical Current Degradation of Ag-Sheathed Bi-2212 Round Wire

30 Aug 2017, 13:15
1h 45m
Posters Area

Posters Area

Poster Presentation of 1h45m F2 - High-Tc Wires and Cables Wed-Af-Po3.09

Speaker

Mr Chao Dai (Institute of Plasma Physics, Chinese Academy of Sciences(ASIPP))

Description

The uniaxial strain induced the critical current degradation of Bi-2212 Ag-sheathed round wire was studied at 4.2 K in 14 T background field. The strains applied on the sample are both tension and compression. An additional tensile strain caused by the difference of thermal expansion between Bi-2212 round wire and Ti-6Al-4V was calculated. Results show that a drastic degradation of the critical current occurred when the strain exceeded 0.35% on tension side. And on compression side, the degradation of critical current was almost linear but more gradual than tensile strain. It is foreseen that these results can provide a basis for Bi-2212 conductor and superconducting coil design.

Submitters Country China

Primary author

Mr Chao Dai (Institute of Plasma Physics, Chinese Academy of Sciences(ASIPP))

Co-author

Presentation Materials