Speaker
Sven Wonsak
(University of Liverpool (GB))
Description
Miniature silicon strip detectors (~1x1cm) with different thicknesses (50, 100, 150 and 300 μm) from Hamamatsu K.K. and Micron Semiconductor Ltd. were irradiated at Birmingham and Ljubljana with doses up to 2E16 neq/cm^2. IV measurements were performed at different temperatures for the determination of the effective energy Eeff and the current related damage rate α directly after irradiation and after room temperature annealing (10 days and 30 days). The results of these measurements performed at Liverpool will be presented in this talk.
A second set of sensors of the same type and irradiation campaign have been measured in Freiburg with a different set-up. These results will be shown by Moritz Wiehe at this workshop.
Author
Sven Wonsak
(University of Liverpool (GB))
Co-authors
Gianluigi Casse
(University of Liverpool (GB))
Ilya Tsurin
(University of Liverpool (GB))
Michael Wormald
(University of Liverpool (GB))
Moritz Wiehe
(Albert-Ludwigs-Universitaet Freiburg (DE))
Paul Dervan
(University of Liverpool (GB))
Susanne Kuehn
(Albert-Ludwigs-Universitaet Freiburg (DE))
Tony Affolder
(University of Liverpool (GB))
Ulrich Parzefall
(Albert-Ludwigs-Universitaet Freiburg (DE))
