Conveners
Tutorial: Micro TCA.4
- Matthias (KIT) Balzer (KIT - Karlsruhe Institute of Technology (DE))
Tutorial: Microelectronics Reliability (G. Groeseneken, IMEC)
- Alessandro Marchioro (CERN)
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Rüdiger Coelln (Pentair)26/09/2016, 09:00Oral
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Heiko Körte (N.A.T.), Vollrath Dirksen (N.A.T.)26/09/2016, 09:45
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Ludwig Petrosyan26/09/2016, 11:00Oral
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Frank Ludwig (DESY)26/09/2016, 11:45
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Guido Groeseneken (IMEC)30/09/2016, 14:00Oral
When scaling down CMOS towards smaller and smaller dimensions, the electrical fields inside the devices is increasing which leads to potential failures of the transistors. This can limit the lifetime of the circuits that are made in these technologies. As a result reliability is becoming more and more a fundamental limiting factor for the further downscaling of the technology. This lecture...
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