TWEPP 2016 - Topical Workshop on Electronics for Particle Physics

Session

Tutorial

TUT

26 Sept 2016, 09:00

Conveners

Tutorial: Micro TCA.4

• Matthias (KIT) Balzer (KIT - Karlsruhe Institute of Technology (DE))

Tutorial: Microelectronics Reliability (G. Groeseneken, IMEC)

• Alessandro Marchioro (CERN)

201. MTCA.4 Basics - Introduction in xTCA

Rüdiger Coelln (Pentair)

26/09/2016, 09:00

Oral

202. MTCA.4 Tutorial and Life Demo

Heiko Körte (N.A.T.), Vollrath Dirksen (N.A.T.)

26/09/2016, 09:45

203. PCIe and PCIe Hot Swap under Linux in MTCA systems

Ludwig Petrosyan

26/09/2016, 11:00

Oral

204. High Performance Measurement Application in MTCA.4

Frank Ludwig (DESY)

26/09/2016, 11:45

197. Reliability and failure mechanisms of Integrated Circuits and devices

Guido Groeseneken (IMEC)

30/09/2016, 14:00

Oral

When scaling down CMOS towards smaller and smaller dimensions, the electrical fields inside the devices is increasing which leads to potential failures of the transistors. This can limit the lifetime of the circuits that are made in these technologies. As a result reliability is becoming more and more a fundamental limiting factor for the further downscaling of the technology. This lecture...