26–30 Sept 2016
Karlsruhe Institute of Technology (KIT)
Europe/Zurich timezone

Session

Tutorial

TUT
26 Sept 2016, 09:00

Conveners

Tutorial: Micro TCA.4

  • Matthias (KIT) Balzer (KIT - Karlsruhe Institute of Technology (DE))

Tutorial: Microelectronics Reliability (G. Groeseneken, IMEC)

  • Alessandro Marchioro (CERN)

Presentation materials

There are no materials yet.

  1. Rüdiger Coelln (Pentair)
    26/09/2016, 09:00
    Oral
  2. Heiko Körte (N.A.T.), Vollrath Dirksen (N.A.T.)
    26/09/2016, 09:45
  3. Ludwig Petrosyan
    26/09/2016, 11:00
    Oral
  4. Frank Ludwig (DESY)
    26/09/2016, 11:45
  5. Guido Groeseneken (IMEC)
    30/09/2016, 14:00
    Oral

    When scaling down CMOS towards smaller and smaller dimensions, the electrical fields inside the devices is increasing which leads to potential failures of the transistors. This can limit the lifetime of the circuits that are made in these technologies. As a result reliability is becoming more and more a fundamental limiting factor for the further downscaling of the technology. This lecture...

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