21–25 Sept 2009
Institut des Cordeliers 15, rue de l'Ecole de Médecine (Métro Odéon) Paris, France
Europe/Paris timezone
<strong>The deadline for paper submission has been extended to 23 October 2009</strong>

Position Measurements with Micro-Channel Plates and Transmission Lines using Pico-second Timing and Waveform Analysis

24 Sept 2009, 16:15
2h 15m
Institut des Cordeliers 15, rue de l'Ecole de Médecine (Métro Odéon) Paris, France

Institut des Cordeliers 15, rue de l'Ecole de Médecine (Métro Odéon) Paris, France

Poster Systems, installation and commissioning POSTERS SESSION

Speaker

Dr Jean-Francois Genat (University of Chicago)

Description

Micro-Channel Plates anodes are coupled to fast transmission lines in order to reduce the number of electronics readout channels, and provide two-dimensions position measurements using centroids and two-ends delay timing. Tests using a laser and waveformanalysis have shown that resolutions of a few hundreds of microns along thetransmission line can be reached. This technique is planned to be used in novel Micro-channel Plates devices integrating the transmission lines as anodes.

Summary

10 and 25 micron pores Micro-Channel Plates devices (MCP) have been connected to 50 Ohms transmission lines printed circuit cards and tested using a 408nm laser focused on the window entrance of the MCP. The numbered of amplified photo-electrons is evaluateded using a single photo-electron sensitive photo-multiplier. Once the velocity along the 10cm-long transmission line is determined, the position along the line is derived from the difference in delays between the two ends of the card. Since the two signals originate from the same pulse at the output of the MCP, their shapes are strongly correlated. Waveform analysis using least square fits to a known template waveform allow extracting the time of arrival of the
pulse at the two ends of the line. The differences of these times show a spread of a few picoseconds, depending mainly on the signal to noise ratio, that depends in turn upon the number of incident photo-electrons and the gain of the MCP set by the high voltage applied to the MCP pores.
Results are presented for 18, 50, and 158 Photoelectrons and high voltages values corresponding to signals with amplitudes between 10 and 500 mV. These results are
in good agreement with both simulations, and timing measurements achieved with off-the-shelf Constant Fraction Discriminators and Time to Amplitude converters.
Results obtained from tests at the Advanced Photon Source at the Argonne National Laboratories where the transmission lines are sitting in the vacuum as close as possible to the MCP output, are also presented and compared to detailed simulations. From these results, it is possible to optimize a design where the transmission lines are integrated to the MCP device itself. This design is also briefly discus

Author

Dr Jean-Francois Genat (University of Chicago)

Co-authors

Dr Bernhard Adams (Argonne National Laboratory) Dr Edward May (Argonne National Laboratory) Dr Eugene Yurtsev (Argonne National Laboratory) Prof. Henry Frisch (University of Chicago) Mr Herve Grabas (Ecole Superieure d'Electricite, France) Dr Karen Byrum (Argonne National Laboratory) Dr Klaus Attenkofer (Argonne National Laboratory) Mrs Mary Heintz (University of Chicago) Mr Richard Northrop (University of Chicago) Dr Robert Stanek (Argonne National Laboratory) Dr Tyler Natoli (University of Chicago)

Presentation materials