3–5 Jun 2009
Freiburg, Germany
Europe/Zurich timezone

Charge collection and trapping effects in n-type and p-type epitaxial silicon diodes after proton irradiation

3 Jun 2009, 15:10
20m
Freiburg, Germany

Freiburg, Germany

Speaker

Joern Lange (Hamburg University)

Description

Epitaxial silicon pad diodes of p-type (150 µm, ST material) and n-type (75 µm, 100 µm, 150 µm, both ST and DO) material have been investigated after 24 GeV/c proton irradiation at CERN PS. Time-resolved TCT measurements with 670 nm laser light (front injection) were performed for 150 µm thick diodes and thus the effective trapping time constants for electrons (n-type) and holes (p-type) could be obtained. CCE measurements with 5.8 MeV alpha particles and 670 nm and 1060 nm laser light showed an anomalously high charge collection.

Author

Joern Lange (Hamburg University)

Co-authors

Eckhart Fretwurst (Hamburg University) Gunnar Lindström (Hamburg University) Julian Becker (Hamburg University)

Presentation materials