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2nd TCT Workshop

17–18 Oct 2016
Jožef Stefan Institute
Europe/Zurich timezone

Contribution List

26 out of 26 displayed
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  1. 27. Welcome
    17/10/2016, 09:55
  2. 2. Advanced TCT systems
    Marko Zavrtanik (Jozef Stefan Institute (SI))
    17/10/2016, 10:00
  3. 3. Two photon absortion Transient Current Technique System
    Marcos Fernandez Garcia (Universidad de Cantabria (ES))
    17/10/2016, 10:30
  4. 7. Laboratory results on LGADs (Timming)
    Marco Ferrero (Universita e INFN Torino (IT))
    17/10/2016, 11:20
  5. 8. TCT in presence of continuos illumination - studies of bulk material
    Gregor Kramberger (Jozef Stefan Institute (SI))
    17/10/2016, 11:40
  6. 25. Resolving authentic time dependence of time-of-flight photocurrent in organic semiconductors
    Egon Pavlica (University of Nova Gorica)
    17/10/2016, 12:00

    Time-of-flight photoconductivity (TOF) is a powerful method, which is used to study conversion of photons to electrons and their transport through thin organic semiconductor layers. Compared to current-voltage characterization methods, TOF results are unaffected by the spurious effects at the semiconductor/metal interfaces. Precise knowledge of photocurrent time-dependence is of crucial...

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  7. 4. Understanding pulse shapes at high fluences
    Marko Mikuz (Jozef Stefan Institute (SI))
    17/10/2016, 12:20
  8. 5. TCT pulse anaysis and corrections
    Gregor Kramberger (Jozef Stefan Institute (SI))
    17/10/2016, 12:40
  9. 13. Beam locator/Beam monitoring/Support PCBs
    Gregor Kramberger (Jozef Stefan Institute (SI)), Sven Wonsak (University of Liverpool (GB))
    17/10/2016, 13:00
  10. 9. Edge TCT on AMS H35 HV-CMOS devices
    Emanuele Cavallaro (IFAE - Barcelona (ES))
    17/10/2016, 16:00
  11. 16. Edge-TCT measurements on different HVCMOS devices
    Bojan Hiti (Jozef Stefan Institute (SI))
    17/10/2016, 16:20
  12. 11. Edge-TCT measurements
    Finn Feindt (University of Hamburg)
    18/10/2016, 09:30
  13. 10. TCT measurements on 3D detectors
    Lluis Simon
    18/10/2016, 09:50
  14. 24. TCT measurements on diodes
    William Holmkvist (C)
    18/10/2016, 10:10
  15. 26. Temperature dependance of LGAD response
    Roberto Mulargia (Universita e INFN Torino (IT))
    18/10/2016, 10:30
  16. 20. Comparison of different signal simulation tools
    Gregor Kramberger (Jozef Stefan Institute (SI))
    18/10/2016, 11:10
  17. 21. TCAD simulations
    Marco Bomben (Centre National de la Recherche Scientifique (FR))
    18/10/2016, 11:30
  18. 22. Update on TRACS
    Marcos Fernandez Garcia (Universidad de Cantabria (ES))
    18/10/2016, 11:50
  19. 23. Update on KDetSim
    Gregor Kramberger (Jozef Stefan Institute (SI))
    18/10/2016, 12:00
  20. 17. Comparison of different simulations tools and update on KDetSim
    Gregor Kramberger (Jozef Stefan Institute (SI))
  21. 14. Diode measurements and pulse analysis with TCT

    1.) Analysis of the signal - reflection
    2.) Mobility measurements

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  22. 12. Mobility measurements
  23. 15. Scanning TCT - example of operation

    1.) Beam condition monitoring at work (fibre split and in-beam version)
    2.) Cabling issues and related problems
    3.) Tunning the right signal
    4.) Beam locator

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  24. 6. Single event effect tests with focused light
    Samo Korpar (Jozef Stefan Institute (SI))
  25. 18. TCAD simulations
    Marco Bomben (Centre National de la Recherche Scientifique (FR))
  26. 19. Update on TRACS simulation