Design and Development of an Event-driven SOI Pixel Detector for X-ray Astronomy

10 Dec 2017, 21:25
1m
Conference Center (Okinawa Institute of Science and Technology Graduate University (OIST))

Conference Center

Okinawa Institute of Science and Technology Graduate University (OIST)

OIST, Onna, Okinawa 904-0495, Japan
POSTER SOI detectors POSTER

Speaker

Dr Ayaki Takeda (University of Miyazaki)

Description

We have been developing monolithic active pixel detectors based on the silicon-on-insulator (SOI) pixel technology, named “XRPIX”, for future X-ray astronomical satellite missions. The XRPIX series offers good time resolution (~1 ${\rm \mu}$s), fast readout time (~10 ${\rm \mu}$s), and wide energy range (0.5–40 keV) in addition to having imaging and spectroscopic capabilities comparable to charge coupled devices (CCDs) which are current standard detectors. A comparator circuit in each pixel is also implemented in order to output hit trigger (timing) and two-dimensional hit-pattern (position) so that signals are read out only from X-ray-detected pixels. X-ray readout by this function is called “event-driven readout”.
We have designed many types of devices to realize event-driven readout and improve performance. In our previous studies, we successfully demonstrated the event-driven readout using small-area devices. We designed the first prototype of a large-area device for satellite loading. The device is 24.6 mm ${\rm \times}$ 15.3 mm in size and consists of 608 ${\rm \times}$ 384 (= ~233k) pixels. The pixel size and the imaging area are 36 ${\rm \mu}$m ${\rm \times}$ 36 ${\rm \mu}$m and 21.9 mm ${\rm \times}$ 13.8 mm, respectively. We have introduced a data processing circuit to obtain pattern information of detected events. This circuit allows us to determine the event type within several operating clocks. We report on the design architecture and evaluation results of the large-area device in the event-driven readout.
We also fabricated a different device with a new pixel structure using Double-SOI wafer to improve the X-ray spectroscopic performance. It is evaluated in the frame readout mode, which reads all pixels periodically analogous to CCDs. We finally achieved the readout noise of about 10 e${\rm ^{-}}$ (rms) and the energy resolution of about 190 eV (FWHM) at 6 keV.

Primary author

Dr Ayaki Takeda (University of Miyazaki)

Co-authors

Dr Koji Mori (University of Miyazaki) Mr Yusuke Nishioka (University of Miyazaki) Mr Nobuaki Takebayashi (University of Miyazaki) Mr Shoma Yokoyama (University of Miyazaki) Mr Kohei Fukuda (University of Miyazaki) Prof. Takeshi Tsuru (Kyoto University) Dr Takaaki Tanaka (Kyoto Univsersity) Dr Hiroyuki Uchida (Kyoto University) Mr Hideaki Matsumura (Kyoto University) Mr Katsuhiro Tachibana (Kyoto University) Mr Hideki Hayashi (Kyoto University) Mr Sodai Harada Dr Takayoshi Kohmura (Tokyo University of Science) Dr Kouichi Hagino (Tokyo University of Science) Mr Kenji Oono (Tokyo University of Science) Mr Kousuke Negishi (Tokyo University of Science) Mr Keigo Yarita (Tokyo University of Science) Prof. Yasuo Arai (High Energy Accelerator Research Organization (JP)) Prof. Ikuo Kurachi (HIgh Energy Accelerator Research Organization) Prof. Shoji Kawahito (Research Institute of Electronics, Shizuoka University) Dr Keiichiro Kagawa (Research Institute of Electronics, Shizuoka University) Dr Keita Yasutomi (Research Institute of Electronics, Shizuoka University) Mr Hiroki Kamehama (Research Institute of Electronics, Shizuoka University) Mr Sumeet Shrestha (Research Institute of Electronics, Shizuoka University) Mr Syunta Nakanishi (Research Institute of Electronics, Shizuoka University)

Presentation materials