29th RD50 Workshop (CERN)

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Sessions*

Collaboration Board

Defect and Material Characterization

CMOS sensors

Registration and Workshop opening

RD50 CMOS project & working group meeting

Pixel and Strip sensors; LHC experiments

TCT & Device simulations

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LGAD, DD-APD, SiPM, UFSD, HFS

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Contributions*

Calculation of the effective space charge profile of a detector using TRACS (in session "TCT & Device simulations")

Characterisation of HFS detectors (in session "LGAD, DD-APD, SiPM, UFSD, HFS")

Characterization of irradiated thin n-in-planar pixel and active edge sensors (in session "Pixel and Strip sensors; LHC experiments")

Charge collection and Lorentz angle measurement on ATLAS12 sensors (in session "Pixel and Strip sensors; LHC experiments")

Common project proposal: Thin-film based silicon sensors (in session "Pixel and Strip sensors; LHC experiments")

Defect centers in nitrogen-enriched high-resistivity n-type silicon induced by high-energy protons (in session "Defect and Material Characterization")

Discussion on Defects and Materials (in session "Defect and Material Characterization")

Discussion session: CMOS & RD50 CMOS project (in session "CMOS sensors")

Discussion: Detectors with Gain - Detectors for timing (in session "LGAD, DD-APD, SiPM, UFSD, HFS")

Discussion: Device Simulation & RD50 Simulation Working Group (in session "TCT & Device simulations")

Discussion: LHC Experiments; New Technologies; Edgeless (in session "Pixel and Strip sensors; LHC experiments")

Edge-TCT studies of irradiated HV-CMOS sensors and first test beam results with monolithic H35demo chips (in session "CMOS sensors")

Fitting the LGAD simulation (in session "TCT & Device simulations")

Impact of electron irradiation on N- and O-enriched FZ silicon p-in-n pad detectors (in session "Defect and Material Characterization")

Insight into the behaviour of futuristic low bulk resistivity Si sensors using device simulation. (in session "TCT & Device simulations")

Ion irradiation and semiconductor detector characterization at the Centro Nacional de Aceleradores [MONDAY] (in session "Defect and Material Characterization")

Laboratory measurement and progress in Low Gain Avalanche Diodes (in session "LGAD, DD-APD, SiPM, UFSD, HFS")

LGAD design for harsh radiation environments using TCAD simulations. (in session "TCT & Device simulations")

Long Term Annealing of ATLAS12 Sensors (in session "Pixel and Strip sensors; LHC experiments")

Magnetoresistance in the irradiated Si microstrip type samples (in session "Defect and Material Characterization")

Measurements on 50um thick LGAD from CNM (in session "LGAD, DD-APD, SiPM, UFSD, HFS")

Near-unity quantum efficiency of broadband black silicon photodiodes with an induced junction (in session "Pixel and Strip sensors; LHC experiments")

Neutron Induced Radiation Damage of KETEK SiPMs (in session "LGAD, DD-APD, SiPM, UFSD, HFS")

New results of measurements with irradiated CMOS detectors in Ljubljana (in session "CMOS sensors")

Note on C-DLTS application for study of radiation damage produced by short range particles. V. Eremin, D. Mitina, E. Verbitskaya (in session "Defect and Material Characterization")

Physical limits on the inter-strip resistance for planar strip sensors (in session "TCT & Device simulations")

Proposal for the organization of an RD50 project aimed at the realization of an Edge-less Device (in session "Pixel and Strip sensors; LHC experiments")

Proton energy dependent damage to thin Silicon pad diodes (in session "Defect and Material Characterization")

Radition damage studies in LGAD detectors from recent CNM and FBK runs (in session "LGAD, DD-APD, SiPM, UFSD, HFS")

RD50 CMOS project (in session "RD50 CMOS project & working group meeting")

Run II Radiation Damage Effects and Operation of the LHCb Vertex Locator (in session "Pixel and Strip sensors; LHC experiments")

Simulation of Dynamic Characteristics of GaN p-i-n Avalanche Diode Type Particle Detector (in session "TCT & Device simulations")

Simulation of Low Gain Avalanche Detector characteristics based on the concept of negative feedback in irradiated silicon detectors with carrier impact ionization (Part II) (in session "TCT & Device simulations")

Status of CNM technological developments on LGAD and future plans (in session "LGAD, DD-APD, SiPM, UFSD, HFS")

Studies of gain and time resolution of 50 µm LGADs before and after irradiation (in session "LGAD, DD-APD, SiPM, UFSD, HFS")

Studies of small-pitch CNM 3D detectors (in session "Defect and Material Characterization")

Study of prototype sensors for the LHCb Upstream Tracker Upgrade (in session "Pixel and Strip sensors; LHC experiments")

TCAD simulations of p-bulk silicon sensors after a large range of fluences (in session "TCT & Device simulations")

Temperature dependence of the response of Ultra Fast Silicon Detectors (in session "LGAD, DD-APD, SiPM, UFSD, HFS")

Test beam and TCT characterization results of i-LGAD and Strip LGAD sensors (in session "LGAD, DD-APD, SiPM, UFSD, HFS")

The new RD50 Logo (in session "LGAD, DD-APD, SiPM, UFSD, HFS")

The RD50 database on measured data (in session "Pixel and Strip sensors; LHC experiments")

TSC Spectra – Point- versus Cluster-Defects (in session "Defect and Material Characterization")

Two Photon edge-TCT measurements of a neutron irradiated HVCMOS (in session "CMOS sensors")

Validation strategy for the simulation of highly irradiated silicon pixel sensors (in session "TCT & Device simulations")

Workshop opening (in session "Registration and Workshop opening")

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Events scheduled on*

11/21/16

11/22/16

11/23/16

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