Speaker
Dr
Vladimir Eremin
(Ioffe Institute)
Description
Short range particles like alphas, low energy protons, ions, etc. are cost effective approaches for the damage production in silicon. The physics of capacitance DLTS application for study of such structures is discussed. The approach is illustrated by the results on silicon detectors irradiated by heavy ions.
Author
Dr
Vladimir Eremin
(Ioffe Institute)
Co-author
Dr
Elena Verbitskaya
(Ioffe Institute)
