May 22 – 26, 2017
Temple University - Philadelphia
US/Eastern timezone

On-line and real-time thickness and density measurement for quality control of thin films using GEMs

May 25, 2017, 3:38 PM
4m
Morgan Hall D301 (Temple University - Philadelphia)

Morgan Hall D301

Temple University - Philadelphia

Morgan Hall, 1398 Cecil B. Moore Ave., Philadelphia, PA 19122, USA

Speaker

Rafael M Gutierrez (Universidad Antonio Nariño)

Description

This work presents a new industrial application of MPGDs for thin films characterization and quality control. This is made by the design and adaptation of an optimal electronics and other technical features of a 3GEM that take advantage of the great qualities of these detectors for the specific application. This work have been developed at the Laboratorio de Detectores of the Universidad Antonio Nariño using a 3GEM for an on-line and real-time apparatus to measure physical properties of thin films, such as thickness, density and grammage during the production processes in industry. This is very important for the production of polymers film extrusion, paper, textiles, aluminum foils, among many others, in order to improve quality and efficiency, reduce costs and reduce environmental impact.
Presently there are different types of on-line instrumentation to perform this type of measurements with different techniques; however all of them provide local measures implying inefficiency, inaccuracy and several sources of errors limiting the solution of the thin films quality control problem. In this work we take advantage of the performance of a 3GEM with an appropriated and controlled radiation source to measure small variations of the energy transmitted and reflected by the thin film under observation. The high gain and relative large detection area of the 3GEM provide an efficient, accurate and low cost quality control of thin films.

Primary authors

Freddy Fuentes Robayo Rafael M Gutierrez (Universidad Antonio Nariño)

Presentation materials

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