Jul 4 – 11, 2018
COEX, SEOUL
Asia/Seoul timezone

Measurement of Single Event Upset rates in single pixels of ATLAS IBL

Jul 6, 2018, 6:30 PM
2h
COEX, SEOUL

COEX, SEOUL

Poster Posters POSTER

Speaker

Peilian Liu (University of California Berkeley (US))

Description

Techniques have been developed to determine the single upset rates in individual pixels in the innermost layer of the ATLAS pixel detector, called IBL. SIngle pixel SEU cannot be observed directly through error reporting of the pixels as there is no such function, nor is there real time monitoring of configuration during operation. Through analysis of cluster data from physics running and time-over-threshold value distributions the upset rates of individual bits have been extracted and compared to expectation from early beam tests of individual devices. The upset rate is large enough to impact precision measurements, such as luminosity determination from cluster rates, which has a 1% target precision. Corrections for SEU must be developed in order to make such measurements.

Primary authors

ATLAS Collaboration Peilian Liu (University of California Berkeley (US))

Presentation materials