18-22 February 2019
Vienna University of Technology
Europe/Vienna timezone

Belle II Pixel Detector – Performance of final DEPFET Modules

19 Feb 2019, 17:45
EI7 ()


Talk Semiconductor Detectors Semiconductor Detectors


Mr Botho Paschen (University of Bonn)


In spring 2018 the SuperKEKB accelerator in Tsukuba, Japan, provided first e+e- -collisions to the upgraded Belle II experiment. During this commissioning phase the volume of the innermost vertex detector was equipped with dedicated detectors for measuring the radiation environment as well as downsized versions of the final Belle II silicon strip (SVD) and pixel (PXD) detectors.
The PXD is the sub-detector closest to the interaction point. It is made from all-silicon modules integrating support structure and sensor. The sensors are pixel matrices of DEpleted P-channel Field Effect Transistors (DEPFET) which are steered and read out by 14 ASICs bump-bonded to each module.
Four of the first available PXD modules of the final iteration were set up in the commissioning PXD detector. They were operated with close-to-final services and their data used to help evaluate accelerator operation.
Final PXD modules were also characterized in the laboratory and at beam tests at DESY. This talk will highlight the results of these performance measurements and the long term tests during accelerator commissioning.
Furthermore a short status and outlook of the final Belle II PXD that will be included in the first physics run is given.

Primary author

Mr Botho Paschen (University of Bonn)

Presentation Materials