Speaker
Marta Baselga Bacardit
(KIT - Karlsruhe Institute of Technology (DE))
Description
Nitrogen enrich material showed an improvement of some defects after irradiation. NitroStrip is an RD50 project that aims to compare nitrogen enriched silicon wafers with FZ, DOFZ and MCz material. This presentation will show CCE measurements and electrical characterization of NitroStrip samples irradiated at different fluences with 23MeV protons.
Author
Marta Baselga Bacardit
(KIT - Karlsruhe Institute of Technology (DE))
Co-authors
Matteo Centis Vignali
(CERN)
Alexander Dierlamm
(KIT - Karlsruhe Institute of Technology (DE))
Eckhart Fretwurst
(Hamburg University (DE))
Jan Cedric Honig
(Albert Ludwigs Universitaet Freiburg (DE))
Pawel Kaminski
(Institute of Electronic Materials Technology)
Michael Moll
(CERN)
Ulrich Parzefall
(Albert Ludwigs Universitaet Freiburg (DE))
Giulio Pellegrini
(Centro Nacional de Microelectrónica (IMB-CNM-CSIC) (ES))
Dr
Joan Marc Rafí
(Consejo Superior de Investigaciones Científicas (CSIC))
Joern Schwandt
(Hamburg University (DE))
Liv Wiik-Fuchs
(Albert Ludwigs Universitaet Freiburg (DE))
Florian Wittig
(KIT)
