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09:20
Measurements of NitroStrip detectors irradiated with 23MeV protons
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Marta Baselga Bacardit
(KIT - Karlsruhe Institute of Technology (DE))
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09:40
Forward and reverse current of highly irradiated silicon pad diodes
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Christian Scharf
(Hamburg University (DE))
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10:00
FORMATION AND ELIMINATION OF RADIATION DEFECTS RESPONSIBLE FOR CHARGE CARRIER REMOVAL IN BORON DOPED SILICON
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Leonid Makarenko
(Belarusian state University)
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10:20
Characterization of acceptor removal in silicon pad diodes irradiated by protons and neutrons
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Pedro Dias De Almeida
(FCT Fundacao para a Ciencia e a Tecnologia (PT))
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11:10
A parametrization of initial acceptor removal
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Nicolo Cartiglia
(INFN Torino (IT))
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11:30
Application of p-i-n photodiodes to charged particle fluence measurements beyond 10^15 1-MeV-neutron-equivalent/cm^2
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Aidan Grummer
(University of New Mexico (US))
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11:50
First measurements with silicon detectors irradiated above 3e17 n/cm2
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Igor Mandic
(Jozef Stefan Institute (SI))
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12:10
Proposal for RD50 common project Mobility of carriers in irradiated Silicon
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Juozas Vaitkus
(Vilnius University (LT))
Juozas Vaitkus
(Vilnius University )
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12:30
Discussion
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Ioana Pintilie
(NIMP Bucharest-Magurele, Romania)