Speaker
Igor Mandic
(Jozef Stefan Institute (SI))
Description
Two sets of passive CMOS detectors were studied: thinned with processed and metalized backplane and not thinned without backplane processing with substrate biased through the implant on top of the device. Detectors were irradiated with neutrons in reactor in Ljubljana. Collected charge was measured with electrons from Sr-90 source using an external amplifier. Depletion depth and charge collection was measured also with Edge-TCT and compared with Sr-90 measurements. Results obtained with two sets of devices were compared. Measurements showed that thinning and backplane processing improves charge collection after irradiation.
Primary author
Igor Mandic
(Jozef Stefan Institute (SI))
Co-authors
Andrej Gorisek
(Jozef Stefan Institute (SI))
Bojan Hiti
(Jozef Stefan Institute (SI))
Gregor Kramberger
(Jozef Stefan Institute (SI))
Marko Mikuz
(Jozef Stefan Institute (SI))
Vladimir Cindro
(Jozef Stefan Institute (SI))
Marko Zavrtanik
(Jozef Stefan Institute (SI))
