21-25 July 2019
Connecticut Convention Center, Level 6
US/Eastern timezone

C3Po1C-02 [07]: Emissivity measurement of materials used in cryogenic temperature

24 Jul 2019, 09:00
2h
Level 6, Cryo Expo Exhibit Hall ()

Level 6, Cryo Expo Exhibit Hall

Speaker

Ms Fuzhi Shen (Technical Institute of Physics and Chemistry, Chinese Academy of Sciences)

Description

Thermal radiation properties of materials are essential for the design of cryogenic apparatus. While the experimental data of the emissivity of materials are not sufficient, especially at cryogenic temperature. In this paper, a home built apparatus based on a two-stage Gifford McMahon crycooler for rapid emissivity measurement was present. Emissivity of materials can be measured rapidly from 20K to room temperature with a dismountable sample test bar. The calibration process of thermal resistor bar and system error have been analysed. Emissivity measurements were performed in aluminium foils in the described apparatus.

Primary authors

Ms Fuzhi Shen (Technical Institute of Physics and Chemistry, Chinese Academy of Sciences) Dr Dong Xu (Technical Institute of Physics and Chemistry, Chinese Academy of Sciences) Mr Xu Li (Technical Institute of Physics and Chemistry, Chinese Academy of Sciences) Mr Huiming Liu (Technical Institute of Physics and Chemistry, Chinese Academy of Sciences) Laifeng Li (Technical Institute of Physics and Chemistry, Chinese Academy of Sciences)

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