21-25 July 2019
Connecticut Convention Center, Level 6
US/Eastern timezone

C1Po2A-01 [24]: Electrical Tree Aging of Epoxy-Based Nanocomposites at Cryogenic Temperature

22 Jul 2019, 14:00
2h
Level 6, Cryo Expo Exhibit Hall

Level 6, Cryo Expo Exhibit Hall

Speaker

Chuanjun Huang (Technical Institute of Physics and Chemistry, Chinese Academy of Sciences)

Description

Epoxy resin plays an important role in the layer insulation of superconducting magnets. The quench phenomenon associated with superconducting magnets often leads to excessive interlayer voltages, which can cause electrical aging of insulating materials. In this paper, tests were conducted to study the tree aging in epoxy resin/BN nanocomposites at 77 K under AC voltages. An experimental cryostat for partial discharge (PD) with optical observation windows was set up. The test samples were prepared with three levels of nanofiller content: 0 wt %, 1 wt %, and 3 wt %. Each group of samples was tested at a range of AC voltages from 8 kV rms (root mean square) to 32 kV rms and the PD experiments were carried out at 298 K and 77 K.

Primary author

Co-authors

Prof. Rongjin Huang (Technical Institute of Physics and Chemistry, Chinese Academy of Sciences) Dr Hongyu Dong (Technical Institute of Physics and Chemistry, Chinese Academy of Sciences) Mr Kaikai Zhang (Technical Institute of Physics and Chemistry, Chinese Academy of Sciences) Dr Xu Li (Technical Institute of Physics and Chemistry, Chinese Academy of Sciences) Chuanjun Huang (Technical Institute of Physics and Chemistry, Chinese Academy of Sciences) Prof. Laifeng Li (Technical Institute of Physics and Chemistry of the Chinese Academy of Sciences) Ms Fuzhi Shen

Presentation Materials