Resolution Limits of a single crystal scintillator based X-ray Microradiography Camera

Speaker

Mr Jan Tous (CRYTUR, spol. s r.o.)

Description

Recently, high resolution micrography became of great interest. Very thin scintillator layers of about 5-20 micrometers are used to achieve spatial resolution below one micrometer in application for low energy X-ray micro-radiography. Such thin screens are mainly used in micro-CT and nano-CT systems with either micro-focus X-ray tubes or with synchrotron sources.
This work deals with a high resolution CCD camera together with different optical systems and different single crystal scintillators in application for low energy X-ray micro-radiography. The light distribution on the screen is transferred by an optical system to a high-resolution CCD or CMOS chip. A theoretical modeling and practical comparison of several set-ups has been done to investigate the system resolution limits. Thin screens used were prepared from different scintillators. The resolution is presented on test patterns.

Primary author

Mr Jan Tous (CRYTUR, spol. s r.o.)

Co-authors

Mr Jiri Parizek (CRYTUR, spol. s r.o.) Mr Karel Blazek (CRYTUR, spol. s r.o.) Miroslav Sulc (Academy of Sciences of the Czech Republic/Institute of Plasma Physics) Mr Radek Melich (Academy of Sciences of the Czech Republic/Institute of Plasma Physics) Mr Martin Dusek (Academy of Sciences of the Czech Republic/Institute of Plasma Physics) Mr Tomas Vanek (Academy of Sciences of the Czech Republic/Institute of Physics)

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