The synchrotron radiation facility provides monochromatic X-rays but the beams have higher harmonics contamination. We proposed multi-energy X-ray diffractions using the primary and higher harmonics beams. This method could acquire larger Q information with the same exposure time of monochromatic beam measurement. Furthermore, the white X-ray Laue diffraction could determine the lattice spacing by measuring the angle and energy of diffraction patterns. According to this concept, we developed a Wide Energy Range Pixel Array Detector (WERPAD) combined with a CdTe sensor and photon-counting ASICs. A single platinum-electrode (X-ray irradiation side) and 190 × 200 matrix of aluminum-electrodes (readout side) were processed on a high resistivity p-type CdTe single crystal of 0.75 mm in thickness. A high Schottky barrier was formed on the Al/CdTe interface and this condition leads us to operate an electron-collecting diode pixel detector. SP8-04F10K ASICs have been fabricated with the TSMC 180 nm technology. Each pixel has a preamplifier, a shaper, 3-level window-type comparators and a 24-bits counter. WERPAD2 was designed with a pixel size of 0.2 mm by 0.2 mm and an area of 38.2 mm by 40.2 mm. Simultaneous X-ray diffraction measurement with 61.4 keV and 122.8 keV X-ray beams was performed with a carbon steel specimen by the dual window comparator mode. The phase transformation process was measured with conical nozzle levitation. White X-ray Laue diffractions has investigated to measure strains of coarse-grained materials. The diffraction spot energies were determined by the threshold scans. The strains of the bending specimen were measured, and the results corresponded to the applied strains estimated with the strain gauge.
|Submission declaration||Original and unpublished|