27–31 Jan 2020
Tbilisi State University
Asia/Tbilisi timezone

Silicon Pixel Detector Test-beam Studies for the CLIC Tracking System

31 Jan 2020, 09:40
20m
Building I, Room 317 (Tbilisi State University)

Building I, Room 317

Tbilisi State University

1 Chavchavadze Av., Tbilisi, Vake district

Speaker

Magdalena Munker (CERN)

Description

Challenging requirements are imposed on the vertex and tracking system of the detector for the proposed future Compact Linear Collider CLIC. A temporal resolution of a few ns and a spatial resolution of a few $\mu $m need to be achieved simultaneously with a material budget of down to less than one percent per detection layer. Various silicon pixel detector technologies are under investigation in a broad technology R&D programme. CLICpix2, a 65 nm CMOS chip with a pixel pitch of 25 $\mu$m, has been designed to fulfil the requirements of the CLIC vertex detector. Hybrid assemblies with CLICpix2 chips bump-bonded to thin planar active edge sensors have been produced and characterised in beam tests. The large collection electrode ATLASpix monolithic CMOS chip with a pixel size of 40 $\mu$m x 130 $\mu$m has been produced in a 180 nm High-Voltage CMOS process and is under study for the CLIC tracker. Moreover, a small collection-electrode monolithic CMOS chip with a pixel size of 30 $\mu$m x 300 $\mu$m, the CLICTD, has been developed for the CLIC tracker. This novel chip design with sub-pixel segmentation of the analogue frontend is implemented in two variants of a modified 180 nm CMOS imaging process, optimised for fast collection and high spatial resolution. These different detector prototypes are tested using the 6 GeV electron beam at DESY and a EUDET-type reference telescope with the EUDAQ2 DAQ framework. A Timepix3 plane has been integrated in the telescope setup, allowing for a track-time reference of ~1 ns. The different Devices Under Test are read out by the Caribou DAQ system, a versatile data acquisition system based on a System-On-Chip FPGA architecture. Details of the test-beam data-taking setup as well as analysis results will be presented in this talk.

Primary author

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