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24–29 May 2020 Postponed
America/Vancouver timezone

A Read-Out System with Charge Measurement using Time-Over-Threshold Property of NINO ASICs using FPGA.

25 May 2020, 16:00
7h 58m
Poster Readout: Front-end electronics Poster

Speakers

sridhar tripathy Jaydeep Datta Nayana Majumdar (Saha Institute of Nuclear Physics) Supratik Mukhopadhyay (Saha Institute of Nuclear Physics (IN))

Description

A simple inexpensive read-out system has been developed for an RPC based muon imaging system. The Time-Over-Threshold property of the fast pre-amplification, discrimination chip NINO, can be utilized to measure the pulse-height and hence the charge content of a detector signal. The charge profile of an event can be obtained from the fired strips, which localizes the particle track. This alternative way of charge-measurement can reduce the cost of electronics required for a muon tracker with hundreds of readout channels. The NINO output pulse-width from a read-out strip, that triggered by a scintillator hodoscope has been measured using a 1 GHz, 5GS/s oscilloscope. The mean value of the pulse-width has been found to be around 25 ns in the avalanche mode and 60 ns in the streamer mode. The same measurement is also being done with Altera MAX-10 FPGAs. A 400 MHz clock produced using a Phase-Locked loop clock generator can measure the pulse width with an uncertainty of 2.5 ns.

Primary authors

sridhar tripathy Jaydeep Datta Mr SUBHENDU DAS (SINP) Nayana Majumdar (Saha Institute of Nuclear Physics) Supratik Mukhopadhyay (Saha Institute of Nuclear Physics (IN)) Prof. Sandip Sarkar (Saha Institute of Nuclear Physics)

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