31 May 2010 to 2 June 2010
Barcelona
Europe/Zurich timezone

Impact Ioniation in Silicon Detectors

1 Jun 2010, 09:40
20m
Barcelona

Barcelona

Residencia CSIC, Carrer Hospital, 64.
Talk Pad Detector Characterization Pad Detector Characterization

Speaker

Dr Anna Macchiolo (MPI für Physik)

Description

Charge multiplication by impact ionisation is a well known effect in semiconductors. It is used for signal amplification in devices like APD (Avalanche photodiodes) and SiPMs (Silicon Photomultipliers). Such devices are developed and produced in the MPI Semiconductor lab. Based on this experience we can calculate and simulate impact ionisation effects in planar tracking detectors. The results will be compared with measurements.

Primary author

Dr Hans-Guenther Moser (MPI fuer Physik)

Co-authors

Dr Anna Macchiolo (MPI für Physik) Michael Beimforte (MPI für Physik) Rainer Richter (MPI für Physik)

Presentation materials