CERN
Author in the following contributions
- TPA-TCT -- Two Photon Absorption - Transient Current Technique
- DLTS and TSC techniques: A brief introduction
- Welcome
- Discussion Session: Defect Characterization & Acceptor Removal
- Defect characterization in boron doped silicon sensors after exposure to protons, neutrons and electrons
- Simulation of thickness dependence of time resolution for simple planar devices.
- DLTS studies on as irradiated PiN diodes of different resistivity
