Speaker
Description
The electronics operating in the inner layers of the particle detectors of the HL-LHC must survive fluences in the order of 1016 neq/cm2 and ionizing dose levels that can reach several MGy (hundreds of Mrad), making the use of commercial-off-the-shelf (COTS) components impossible. This lecture presents the different electronic systems of particle detectors (read-out chips, DCDC converters, communication systems, etc.) and the challenges that must be faced to develop application-specific integrated circuits (ASICs) that can withstand this extreme radiation environment. In particular, the design strategies adopted to mitigate the impact of SEE, the effects of ultra-high doses on the commercial CMOS technologies used in the development of ASICs for detectors, the radiation effects on power converters and optoelectronics, and the procedures followed to qualify chips will be discussed.