Sep 20 – 24, 2021
America/Vancouver timezone

Simulations for a New Electron Gun for the TITAN EBIT

Not scheduled
20m
Poster Radioactive ion beams, charge breeders and polarized beams Poster Session 2

Speaker

Mr J.D. Cardona (TRIUMF, University of Manitoba)

Description

Highly charged ions (HCIs) can increase precision in Penning trap mass measurements significantly, due to their higher charge state. At the TITAN facility at TRIUMF, an electron beam ion trap (EBIT) provides radioactive HCIs for this purpose. To improve the electron beam properties and its control, a new electron gun is under development.
The electron gun within its TITAN EBIT environment was simulated using the TREK package. A new electrode geometry was chosen and optimized to extract up to 5A, 65 keV electron beams. Due to the strong fringe field of the unshielded 6T magnet, options for the passive and active shielding of the gun were explored. During the design process, careful attention was paid to safety and mechanical considerations. Simulations and the status of the new electron gun will be presented.
This work has been supported by the Natural Sciences and Engineering Research Council (NSERC) of Canada and through TRIUMF by the National Research Council (NRC) of Canada

E-mail for contact person jcardona@triumf.ca
Funding Information Natural Sciences and Engineering Research Council (NSERC) of Canada, TRIUMF by the National Research Council (NRC) of Canada

Primary authors

Mr J.D. Cardona (TRIUMF, University of Manitoba) K. Dietrich (TRIUMF, Heidelberg University) Dr J. Diling (TRIUMF, Univeristy of British Columbia) Dr I. Mukul (TRIUMF) Dr A.A. Kwiatkowski (TRIUMF, University of Victoria) Dr G. Gwinner (University of Manitoba)

Presentation materials