Speaker
Dr
Vagelis Gkougkousis
(CERN)
Description
Using Secondary Ion Mass Spectroscopy, the carbon and boron doping profile distributions of FBK and CNM LGADs are discussed. Obtained results are cross-referenced with previously reported performance of measured devices and conclusions are established with respect tot the carbonated process implementation.
Author
Dr
Vagelis Gkougkousis
(CERN)
