17–19 Nov 2021
ADEIT
Europe/Zurich timezone

Gain suppression mechanism in LGADs and SEE studies in a RD53B chip measured with the TPA-TCT method

17 Nov 2021, 15:05
20m
ADEIT

ADEIT

Plaza Virgen de la Paz, 3. 46001 Valencia, Spain

Speaker

Sebastian Pape (Technische Universitaet Dortmund (DE))

Description

The Two Photon Absorption – Transient Current Technique (TPA-TCT) uses fs-pulsed infrared lasers, with photon energies below the silicon band gap. Excess charge carriers are generated mainly in a small volume (approximately 1µm × 1µm × 20µm) around the focal point of the laser beam, enabling resolution in all three spatial directions. Following the initial success of the method, a compact TPA-TCT setup was developed at CERN. The current setup status, first measurements on LGAD sensors with focus on the gain suppression mechanism, measurements on non-irradiated PIN diodes, and Single Event Effect (SEE) studies in a RD53B chip will be presented.

Primary author

Sebastian Pape (Technische Universitaet Dortmund (DE))

Co-authors

Esteban Curras Rivera (CERN) Francisco Rogelio Palomo Pinto (Universidad de Sevilla (ES)) Ivan Vila Alvarez (Instituto de Física de Cantabria (CSIC-UC)) Marcos Fernandez Garcia (Universidad de Cantabria and CSIC (ES)) Michael Moll (CERN) Moritz Oliver Wiehe (Austrian Academy of Sciences (AT)) Raúl Montero Santos (Universidad del Pais Vasco)

Presentation materials