17–19 Nov 2021
ADEIT
Europe/Zurich timezone

Test results of the first 4H-SiC LGAD from NJU China

17 Nov 2021, 09:40
20m
ADEIT

ADEIT

Plaza Virgen de la Paz, 3. 46001 Valencia, Spain

Speakers

Dr Tao Yang (Chinese Academy of Sciences (CN))Dr Qing Liu (Nanjing University)

Description

SiC as a typical wide bandgap semiconductor material has the potential to be used in the high energy field thanks to its good performance under radiation environment as well as running without cooling compared with traditional Si devices. Followed by the previous study of the timing performance of the 4H-SiC PIN device, a first 4H-SiC LGAD has been fabricated by Nanjing University (NJU) China. The device has 20µm active layer and 0.15µm gain layer. The preliminary test results of the electrical properties and response from alpha particle will be presented.

Authors

Dr Tao Yang (Chinese Academy of Sciences (CN)) Dr Qing Liu (Nanjing University) Hai Lu (Nanjing University) Xin Shi (Chinese Academy of Sciences (CN))

Presentation materials