22–26 Jul 2024
CICG - GENEVA, Switzerland
Europe/Zurich timezone

Thermal conductance measurement of electrically insulated joints for cryogenic applications

25 Jul 2024, 14:00
2h
Poster area

Poster area

Poster Presentation (120m) ICEC 12: Thermal properties and numerical studies Thu-Po-3.4

Speaker

Vijay Soni (GE HealthCare Technology and Innovation Center, Niskayuna, NY 12309, USA)

Description

One of the important aspects of any cryogenic design is to achieve good thermal performance by minimizing the temperature gradient at different contact regions of the thermal mass. In some cases, electrical isolation may be required at contact regions. Different combinations of the thermally conductive and at the same time electrically insulated joints have been characterized using a GM cryocooler based conduction-cooled test rig (CCR). A two stage CCR has been used to cool sample stacks down to 4 K with measured temperature differences across the sample stack up to 110 K, by increasing the 2nd stage temperature. Different types of ceramics and polyimide (Kapton sheet) have been used as an electrical insulator, stacked in between copper blocks and a 2nd stage copper bus bar. Ceramic materials have been coated on copper blocks with surface roughness (roughness average, Ra) that varies from 9 to 14 µm for different ceramics measured, using chromatic white light profilometry (CWLP), whereas bare copper blocks for samples and the 2nd stage copper busbar show a milled finish roughness average of Ra = 1.6 to 3.2 µm. We present a detailed, comparative study of novel thermal contact conductance measurements by using different material combinations.

Submitters Country United States

Author

Vijay Soni (GE HealthCare Technology and Innovation Center, Niskayuna, NY 12309, USA)

Co-authors

Ernst Wolfgang Stautner (GE HealthCare Technology and Innovation Center, Niskayuna, NY 12309, USA) Anbo Wu (GE HealthCare Technology and Innovation Center, Niskayuna, NY 12309, USA) Gene Conte (GE HealthCare Technology and Innovation Center, Niskayuna, NY 12309, USA) Christopher Van Epps (GE HealthCare Technology and Innovation Center, Niskayuna, NY 12309, USA) Celik Dogan (GE HealthCare, Florence, SC 29501, USA) Minfeng Xu (GE HealthCare Technology and Innovation Center, Niskayuna, NY 12309, USA) Stuart Feltham (GE HealthCare, Florence, SC 29501, USA)

Presentation materials