Speaker
Description
The counting process of individual physical events in the presence of an extended dead time (EDT) in the electronics results in the saturation and quenching of the counting rate, due to pile-up. This effect can be accounted for, on average, by inverting the saturation curve, provided the electronics double pulse resolution associated with the counting process is known. In the present work, we investigate the resulting statistical uncertainty on the reconstructed (i.e. corrected for pile-up) event rates. To this end, we perform extensive numerical simulations of the pile-up itself and of its inversion procedure, and compare the results with direct measurements of the saturation curve and its statistical properties, as obtained with multi-anode photomultiplier tubes (MAPMTs) in single photoelectron counting mode, using the SPACIROC-3 ASIC.
| Eligibility for "Best presentation for young researcher" or "Best poster for young researcher" prize | No |
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