Training on semiconductor devices, design and manufacturing

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Sessions*

Electrical Testing, Assembly and TCAD Simulations.

Semiconductor Manufacturing Processes

Surface Analysis and Solids Characterization

Visit to STMicroelectronics M5 8” Clean Room Facilities

Technology Development and Applications

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Contributions*

Brief Introduction of STMicroelectronics and Microelectronics Historical Notes (in session "Semiconductor Manufacturing Processes")

Conclusions and Debriefing

Electrical Parametric Testing (in session "Electrical Testing, Assembly and TCAD Simulations.")

Electronic Devices Packaging (in session "Electrical Testing, Assembly and TCAD Simulations.")

First Group Visit (19 Participants) (in session "Visit to STMicroelectronics M5 8” Clean Room Facilities")

Focused Ion Beam (FIB) and Scanning Electron Microscopy (SEM) (in session "Surface Analysis and Solids Characterization")

Optical Microscopy, Fault Detection and Isolation Techniques (in session "Surface Analysis and Solids Characterization")

Registration

Samples Preparation and Transmission Electron Microscopy (TEM) (in session "Surface Analysis and Solids Characterization")

Second Group Visit (19 Participants) (in session "Visit to STMicroelectronics M5 8” Clean Room Facilities")

Semiconductors Processing and Devices Fabrication - 1st part (crystal growth and epitaxy, thermal oxidation, ion implantation and diffusion) (in session "Semiconductor Manufacturing Processes")

Semiconductors Processing and Devices Fabrication – 2nd part (Thin film deposition, photolithography, plasma basics, etching and new trends in microelectronics industry) (in session "Semiconductor Manufacturing Processes")

STMicroelectronics Silicon Photomultiplier Technology (in session "Technology Development and Applications")

TCAD Process and Device Simulations (in session "Electrical Testing, Assembly and TCAD Simulations.")

Time-of-Flight PET Detector Development with SiPMs (in session "Technology Development and Applications")

Welcome and Introduction to the Course

X-Ray Photoelectron Spectroscopy (XPS) and Secondary Ion Mass Spectrometry (SIMS) (in session "Surface Analysis and Solids Characterization")

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Events scheduled on*

01/07/2013

02/07/2013

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