Speaker
Dr
Fco. Rogelio Palomo Pinto
(School of Engineering University of Sevilla)
Description
We present a compendium of our latest works about simulation of radiation effects in electronics using Sentaurus TCAD. Adapting the tool, we simulate pulsed laser ionization effects, ion tracks, total ionization dose and displacement damage.
Primary author
Dr
Fco. Rogelio Palomo Pinto
(School of Engineering University of Sevilla)
Co-author
Dr
Salvador Hidalgo
(Microelectronics National Center CNM-IMB)
