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This paper aims at an improved understanding of thermoluminescence of (Lu1-xYx)2SiO5:Ce (x=0 at.%, 9 at.%, 26 at.%, 45 at.%, 66 at.% , 88 at.% and 100 at.%). Wavelength-resolved thermally stimulated luminescence (TSL) spectra and vacuum ultraviolet excitation spectra as well as transmittance spectra of (Lu1-xYx)2SiO5:Ce were investigated as a function of yttrium (shortened as Y) content in it. Obtained thermal depth of electron traps Et indicates that: with the increase of Y content, Et corresponding to the higher temperature peak (~ 336 K) increases, while Et corresponding to the lower temperature peak (~ 100 K) presents a slight decrease and then increase trend. Besides, it was found that: with the increase of Y content, band gap presents an obvious increase trend. The kinetic process and recombination mechanism of de-trapped electrons are discussed.
