Dec 2 – 4, 2015
CERN
Europe/Zurich timezone

Remarks on the thermally stimulated current measurement

Dec 2, 2015, 12:00 PM
20m
6/2-024 - BE Auditorium Meyrin (CERN)

6/2-024 - BE Auditorium Meyrin

CERN

6-2-024
114
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Standard (20 min including discussion) Defect Characterization

Speaker

Juozas Vaitkus (Vilnius University)

Description

The measurement of thermally stimulated current was performed in the irradiated silicon pad detectors excited by light and by forward current. The TSC measurement was performed in the reverse bias regime. The differences in the spectrum are explained by a contribution of the non-equilibrium holes on the modulation of the microinhomogeneities related to the clusters and recombination in the case of light excitation.

Author

Juozas Vaitkus (Vilnius University)

Co-authors

Mr Gytis Brazdziunas (Vilnius University) Mr Vytautas Rumbauskas (Vilnius University)

Presentation materials