11th International "Hiroshima" Symposium on the Development and Application of Semiconductor Tracking Detectors (HSTD11) in conjunction with 2nd Workshop on SOI Pixel Detectors (SOIPIX2017) at OIST, Okinawa, Japan

Development of Debye-Ring Measurement System Using SOI Pixel Detector

15 Dec 2017, 10:00

20m

Conference Center (Okinawa Institute of Science and Technology Graduate University (OIST))

ORAL SOI detectors Session15

Speaker

Dr Shingo Mitsui (Kanazawa university)

Description

In recent industrial sites of the fabricated metal product manufacturing, total inspection of residual stress or hardness in non-destructive non-contact is required. However, the conventional measurement system only used in a sampling inspection because it takes a long time to measure. Therefore, we are developing high speed Debye-ring measurement system using integration-type SOI pixel detector, INTPIX4 which can evaluate material characteristics for industrial use.
INTPIX4 is an X-ray imager with 832 x 512 pixels, each of pixel size 17 $\mu$m square. By using SEABAS2 readout board it is possible to measure Debye-rings up to 45 times for 1 second. The developed system is a compact and high speed Debye-ring measurement system thanks to two INTPIX4s and a compact high power X-ray tube.
In this presentation, we introduce the developed system and report its properties.

Presentation materials

HSTD11_mitsui_v1.pdf