TWEPP 2017 Topical Workshop on Electronics for Particle Physics

Session

Radiation Tolerant Components and Systems

A

11 Sept 2017, 14:50

Earth and Marine Sciences (E&MS) Building

Conveners

Radiation Tolerant Components and Systems

• Salvatore Danzeca (CERN)

Radiation Tolerant Components and Systems

• Geoff Hall (Imperial College (GB))

57. Radiation Hardness Studies and Evaluation on SRAM-Based FPGA for High Energy Physics Experiments

Vlad-Mihai PLACINTA (Horia Hulubei National Institute for R&D in Physics and Nuclear Engineering (IFIN-HH) & Polytechnic University of Bucharest)

11/09/2017, 14:50

Radiation Tolerant Components and Systems

Oral

Being a proposed solution for the digital boards of the upgraded LHCb RICH sub-detectors, SRAM-based FPGA devices have become widely used in high energy physics experiments. These studies aim to present the radiation hardness measurements done on the KINTEX-7 FPGA during irradiation with protons, X-rays and ions beams. For multiple values of the total ionising dose, linear energy transfer and...

101. Effect of Gamma Irradiation on Leakage Current in CMOS Readout Chips for the ATLAS Upgrade Silicon Strip Tracker at the HL-LHC

Stefania Antonia Stucci (Brookhaven National Laboratory (US))

11/09/2017, 15:15

Radiation Tolerant Components and Systems

Oral

As part of the program for the upgrade of the ATLAS inner tracker for the High Luminosity LHC, irradiations have been carried out with 60Co gamma source. The measurements characterize the increase in the leakage current in the 130 nm-technology readout chips. The current as a function of total ionizing dose has been studied under different conditions: dose rate, temperature, power applied to...

103. A SEU Tolerant Latches Study for the RD53A Chip

Denis Fougeron (Centre National de la Recherche Scientifique (FR))

11/09/2017, 15:40

Radiation Tolerant Components and Systems

Oral

Abstract:
The RD53 collaboration was established to develop the next generation of pixel readout chips needed by ATLAS and CMS at the HL-LHC and requiring extreme rate and radiation tolerance. The 65 nm CMOS process is adopted in order to satisfy the high level of integration requirement. The SEU immunity for this highly scaled process should be carefully considered because the device...

150. Measurements and Simulations of Single-Event Upsets in a 28 nm FPGA

Markus Preston (Stockholm University (SE))

14/09/2017, 08:55

Radiation Tolerant Components and Systems

Oral

Single-Event Upsets (SEUs) in the configuration memory of a 28 nm FPGA, used in the PANDA electromagnetic calorimeter, have been studied. Results from neutron and proton irradiations are presented. A GEANT4-based Monte Carlo simulation of SEU mechanisms in nanometric silicon volumes has been developed for studies of the energy dependence. At PANDA, a neutron flux of $1\cdot10^2$ cm$^{−2}$...

107. Radiation Hard GaNFET High Voltage Multiplexing (HV-Mux) for the ATLAS Upgrade Silicon Strip Tracker

David Lynn (Brookhaven National Laboratory (US))

14/09/2017, 09:20

Radiation Tolerant Components and Systems

Oral

The outer radii of the inner tracker (ITk) for the Phase-II Upgrade of the ATLAS experiment will consist of groups of silicon strip sensors mounted on common support structures. Lack of space creates a need to remotely disable a failing sensor from the common HV bus. We have developed circuitry consisting of a GaNFET transistor and a HV Multiplier circuit to disable a failed sensor. We will...