Conveners
Radiation Tolerant Components and Systems
- Salvatore Danzeca (CERN)
Radiation Tolerant Components and Systems
- Geoff Hall (Imperial College (GB))
Being a proposed solution for the digital boards of the upgraded LHCb RICH sub-detectors, SRAM-based FPGA devices have become widely used in high energy physics experiments. These studies aim to present the radiation hardness measurements done on the KINTEX-7 FPGA during irradiation with protons, X-rays and ions beams. For multiple values of the total ionising dose, linear energy transfer and...
As part of the program for the upgrade of the ATLAS inner tracker for the High Luminosity LHC, irradiations have been carried out with 60Co gamma source. The measurements characterize the increase in the leakage current in the 130 nm-technology readout chips. The current as a function of total ionizing dose has been studied under different conditions: dose rate, temperature, power applied to...
Abstract:
The RD53 collaboration was established to develop the next generation of pixel readout chips needed by ATLAS and CMS at the HL-LHC and requiring extreme rate and radiation tolerance. The 65 nm CMOS process is adopted in order to satisfy the high level of integration requirement. The SEU immunity for this highly scaled process should be carefully considered because the device...
Single-Event Upsets (SEUs) in the configuration memory of a 28 nm FPGA, used in the PANDA electromagnetic calorimeter, have been studied. Results from neutron and proton irradiations are presented. A GEANT4-based Monte Carlo simulation of SEU mechanisms in nanometric silicon volumes has been developed for studies of the energy dependence. At PANDA, a neutron flux of $1\cdot10^2$ cm$^{−2}$...
The outer radii of the inner tracker (ITk) for the Phase-II Upgrade of the ATLAS experiment will consist of groups of silicon strip sensors mounted on common support structures. Lack of space creates a need to remotely disable a failing sensor from the common HV bus. We have developed circuitry consisting of a GaNFET transistor and a HV Multiplier circuit to disable a failed sensor. We will...
