International Workshop on Semiconductor Pixel Detectors for Particles and Imaging (PIXEL2018)

Single Event Upsets in the ATLAS IBL Frontend ASICs

12 Dec 2018, 10:15

25m

Activity Center (Academia Sinica, Taipei)

ORAL Front end electronics and readout ASICs, Electronics

Speaker

Yosuke Takubo (High Energy Accelerator Research Organization (JP))

Description

During operation at instantaneous luminosities of up to 2 10^34/cm^2/s the
frontend chips of the ATLAS innermost pixel layer (IBL) experienced single
event upsets affecting its global registers as well as the settings for
the individual pixels, causing, amongst other things loss of occupancy,
noisy pixels, and silent pixels. A quantitative analysis of the single event
upsets as well as the operational issues and mitigation techniques will
be presented.

Presentation materials

ibl_seu181212.pdf