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# 12th International "Hiroshima" Symposium on the Development and Application of Semiconductor Tracking Detectors (HSTD12) at Hiroshima, Japan

Dec 14 – 18, 2019
International Conference Center Hiroshima
Japan timezone

## The effects of trapped charge on the signal formationand on the detection efficiency for subsequent pulses inirradiated silicon sensors at operating temperature

Dec 14, 2019, 3:00 PM
1m
POSTER - Sun: B1F-Meeting room#3, B2F-RAN1/2; Mon-Wed: B1F Meeting rooms #5-6 (International Conference Center Hiroshima)

### POSTER - Sun: B1F-Meeting room#3, B2F-RAN1/2; Mon-Wed: B1F Meeting rooms #5-6

#### International Conference Center Hiroshima

Peace Memorial Park, Hiroshima-shi

### Speaker

Liv Wiik-Fuchs (Albert Ludwigs Universitaet Freiburg (DE))

### Description

Envisaged high energy physics experiments like the Future Circular Collider require unprecedented radiation hardness of the detectors, as well as short readout time due to high luminosity and occupancy. Silicon has proven to be extremely radiation hard, clear and fast signals can be recorded even at fluences close to $1\cdot10^{16}~n_{eq}/\mathrm{cm}^2$.
The signal formation in silicon strip sensors, irradiated and annealed until the phenomenon of charge multiplication occurred, was studied. ATLAS12EC R0 mini sensors were tested by means of Edge TCT measurements at temperatures around $-20^\circ\mathrm{C}$.
It was observed that the flow of generated charge changes the signal pulse in time, especially in charge multiplication regime. Moreover, it was observed that the detection of subsequent signals separated even several microseconds is altered by the charge trapped during the first pulses.
The effects of trapped charge on the electrical configuration of a sensor is well known as a pumping effect in larger band-gap materials like diamond, but is often neglected for silicon at this relatively high temperature.
The investigation of the effect created by trapped charges in silicon sensors using subsequent pulses allows to gain information on important parameters such as de-trapping times. Furthermore, it shows a severe impact on the sensor performance in a pile-up scenario. The irradiation fluence and hence the effective doping concentration, the temperature and the amount of initially created charge have a large impact on this phenomenon.
The presented measurements help to characterize this phenomenon and particular attention was paid at the application point of view.

Submission declaration Original and unpublished

### Primary authors

Leena Diehl (Albert Ludwigs Universitaet Freiburg (DE)) Riccardo Mori (Albert Ludwigs Universitaet Freiburg (DE))

### Co-authors

Liv Wiik-Fuchs (Albert Ludwigs Universitaet Freiburg (DE)) Marc Hauser (Albert Ludwigs Universitaet Freiburg (DE)) Yoshinobu Unno (High Energy Accelerator Research Organization (JP)) Vitaliy Fadeyev (University of California,Santa Cruz (US)) Ulrich Parzefall (Albert Ludwigs Universitaet Freiburg (DE)) Karl Jakobs (Albert Ludwigs Universitaet Freiburg (DE))

### Presentation materials

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