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Strip sensor performance in prototype modules built for ATLAS ITk

Dec 14, 2019, 2:35 PM
1m
POSTER - Sun: B1F-Meeting room#3, B2F-RAN1/2; Mon-Wed: B1F Meeting rooms #5-6 (International Conference Center Hiroshima)

POSTER - Sun: B1F-Meeting room#3, B2F-RAN1/2; Mon-Wed: B1F Meeting rooms #5-6

International Conference Center Hiroshima

Peace Memorial Park, Hiroshima-shi
POSTER Strip sensors POSTER

Speaker

Vitaliy Fadeyev (University of California,Santa Cruz (US))

Description

The ATLAS Phase-II Upgrade for the High-Luminosity LHC features replacement of the Inner Detector with an all-silicon Inner Tracker (ITk). The majority of the instrumented area in ITk is occupied by strip modules covering 165 m^2. A vigorous R&D program has been on-going for many years to prepare for the scale of the project and to work out technical issues at all key components of the system, including the strip sensors, readout ASICs, hybrids, modules, and staves.

In this submission we report on the performance of silicon strip sensors used in the last completed round of module prototyping. Over 80 modules were built and tested with electrical readout on the per-channel basis and the sensor performance was assessed. In general, an excellent performance was observed, consistent with previous ASIC-level and sensor-level tests. However, the lessons learned included two phenomena important for the future phases of the project. First was the need to store and test the modules in a dry environment due to humidity sensitivity of the sensors. The second was a rare observation of high noise on some channels, at the rate of about 3%.

The high noise regions were tested further in several ways, including monitoring the performance as a function of time and bias voltage. Additionally, direct sensor-level tests were performed on the affected channels. The inter-strip resistance and bias resistance tests showed low values, indicating a temporary loss of the inter-strip isolation. A subsequent recovery of the noise performance was observed. We present the test details, an analysis of how the inter-strip isolation affects the module noise, and relationship with sensor-level quality control tests.

Submission declaration Original and unpublished

Primary authors

Vitaliy Fadeyev (University of California,Santa Cruz (US)) Cole Michael Helling (University of California,Santa Cruz (US)) Philip Patrick Allport (University of Birmingham (UK)) Tony Affolder (University of California,Santa Cruz (US)) Jose Bernabeu (Universidad de Valencia) Zachary Galloway Matthew Gignac (University of California,Santa Cruz (US)) Dag Gillberg (Carleton University) James Julian Glover (University of Birmingham (GB)) Laura Gonella (University of Birmingham (UK)) Jane Gunnell Bart Hommels (University of Cambridge (GB)) Amelia Hunter (University of Birmingham (GB)) John Stakely Keller (Carleton University (CA)) Christoph Thomas Klein (University of Cambridge (GB)) Thomas Koffas (Carleton University (CA)) Carlos Lacasta Llacer (IFIC-Valencia) Forest Martinez-Mc Kinney (University of California,Santa Cruz (US)) Nathan Jihoon Kang (University of California,Santa Cruz (US)) Simon Pyatt (University of Birmingham (GB)) Carles Solaz Contell (Univ. of Valencia and CSIC (ES)) Ezekiel Staats (Carleton University (CA)) Juergen Thomas (University of Birmingham (GB)) Joseph Yarwick (UC Santa Cruz)

Presentation materials