18–20 Nov 2019
CERN
Europe/Zurich timezone

Evidence of charge multiplication in silicon detectors operated at a temperature of 1.9 K

18 Nov 2019, 11:00
20m
30/7-018 - Kjell Johnsen Auditorium (CERN)

30/7-018 - Kjell Johnsen Auditorium

CERN

30/7-018
190
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Speaker

Artem Shepelev (Ioffe Institute (RU))

Description

The work is dedicated to studying the kinetics of the process of charge collection in silicon detectors at a temperature of 1.9 K in situ irradiated by protons. The main research method is TCT, which allows one to receive current responses of high time resolution. As a result of in situ tests, non-standard current pulse shapes were obtained, which can be described only within the framework of a two-stage charge transfer process model. The model is complicated by the effects of polarization of the electric field in the detector volume, which creates a region of the electric field of such a magnitude that is sufficient for the avalanche multiplication of charge carriers. The experimental results are analyzed in detail. Based on the analysis, a physical model of charge collection is proposed. Moreover, qualitative and quantitative estimates of the transport parameters of charge carriers in the detector are given.

Authors

Artem Shepelev (Ioffe Institute (RU)) Vladimir Eremin (Ioffe Institute (RU)) Elena Verbitskaya (Ioffe Institute (RU))

Presentation materials