16th RD50 Workshop (Barcelona)

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Sessions*

Defect Characterization

Welcome

Pad Detector Characterization

Collaboration Board Meeting

Workshop Dinner

Full Detector Characterization

New Structures

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Contributions*

3D detector activities at CNM-IMB (in session "New Structures")

A CCE and TCT study on low resistivity MCz-n detectors (in session "Full Detector Characterization")

Alibava system upgrade (in session "Full Detector Characterization")

Annealing effects in irradiated HPK strip detectors measured with SCT128 chip (in session "Full Detector Characterization")

Campaign to identify the future CMS sensor baseline (in session "Full Detector Characterization")

CCE and TCT measurements in Karlsruhe - System Commissioning (in session "Pad Detector Characterization")

Characterization of 75 and 150 micron thin strip and pixel sensore produced at MPP-HLL (in session "Full Detector Characterization")

Characterization of the n-in-p CiS pixel production (in session "Full Detector Characterization")

Charge Collection and Space Charge Distribution in Neutron-Irradiated Epitaxial Silicon Detectors (in session "Pad Detector Characterization")

Charge collection measurements on irradiated planar silicon strip sensors (in session "Full Detector Characterization")

Charge Multiplication in Highly-Irradiated Epitaxial Silicon Diodes (in session "Pad Detector Characterization")

Cluster model in Si (in session "Defect Characterization")

Detailed studies on the E4/E5-defect as main current generator (in session "Defect Characterization")

Development of an EDGE-TCT setup at CERN (in session "Pad Detector Characterization")

discussion on Full Detector Characterization and current projects (in session "Full Detector Characterization")

discussion on Defect Characterization (in session "Defect Characterization")

discussion on New Structures (in session "New Structures")

discussion on Pad Detector Characterization (in session "Pad Detector Characterization")

Evaluation of fluence dependent variations of capacitance and generation current parameters by transient technique (in session "Defect Characterization")

Forward-bias operation of FZ and MCZ silicon detectors made with different geometries in view of their applications as radiation monitoring sensors. (in session "Pad Detector Characterization")

Full 3D Simulation of the New BNL 3D-Trench Electrode Detectors (ICDA) (in session "New Structures")

High-resolution photoinduced transient spectroscopy of defect centers in epitaxial silicon irradiated with high proton fluences (in session "Defect Characterization")

Impact Ioniation in Silicon Detectors (in session "Pad Detector Characterization")

Impact of bulk generation current on operation of floating guard rings in silicon segmented detectors (in session "Full Detector Characterization")

Metal Contacts to High Resistivity Semiconductors (in session "Pad Detector Characterization")

Modeling of 3D silicon detectors (in session "New Structures")

New 2D position sensitive detectors (in session "New Structures")

Optimization of the priming procedure for Thermally Stimulated Currents with heavily irradiated silicon detectors (in session "Defect Characterization")

Outlook on the 2010 n-in-n CiS pixel production on thinned silicon (in session "Full Detector Characterization")

Photoresponse spectrum in differently irradiated and annealed Si (in session "Defect Characterization")

Preliminary results from 3D CMS pixel detectors (in session "New Structures")

Proton Irradiation in Karlsruhe (in session "Pad Detector Characterization")

Status of the n-in-n CiS pixel production (in session "Full Detector Characterization")

Study of dominant recombination defects by fluence dependent variations of carrier lifetimes and drift parameters in MCZ Si wafers and pad-detectors (in session "Defect Characterization")

Study on 50, 75 and 150um thick p-type Epitaxial silicon pad detectors irradiated with protons and neutrons (in session "Pad Detector Characterization")

Summary report of the WODEAN meeting at Bucharest, 13-14 May 2010 (in session "Defect Characterization")

Test Beam and Laser Measurements of Irradiated 3D Silicon Strip Detectors (in session "New Structures")

Test beam results of MCz-Si detectors (in session "Full Detector Characterization")

Welcome (in session "Welcome")

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Events scheduled on*

31/05/2010

01/06/2010

02/06/2010

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