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31 May 2010 to 2 June 2010
Barcelona
Europe/Zurich timezone

Campaign to identify the future CMS sensor baseline

1 Jun 2010, 14:30
20m
Barcelona

Barcelona

Residencia CSIC, Carrer Hospital, 64.
Talk Other topics Full Detector Characterization

Speaker

Frank Hartmann (KIT - IEKP)

Description

CMS ordered a large variety of wafers in different thicknesses and technologies at HPK. Thicknesses from 50 - 300um are explored on floatzone, magnetic Czochralski and EPI material. Wafers are all coming in p-in-n and n-in-p versions. Every wafer contains different structures to answer different questions, e.g. geometry, Lorentz angle, radiation tolerance, annealing behaviour.

Primary author

Frank Hartmann (KIT - IEKP)

Presentation materials